DPG Phi
Verhandlungen
Verhandlungen
DPG

Regensburg 2010 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe

O: Fachverband Oberflächenphysik

O 41: Poster Session I (Semiconductor Substrates: Epitaxy and growth; Semiconductor Substrates: Adsorbtion; Semiconductor Substrates: Solid-liquid interfaces; Semiconductor Substrates: Clean surfaces; Oxides and insulators: Epitaxy and growth; Oxides and insulators: Adsorption; Oxides and insulators: Clean surfaces; Organic, polymeric and biomolecular films - also with adsorbates; Organic electronics and photovoltaics, Surface chemical reactions; Heterogeneous catalysis; Phase transitions; Particles and clusters; Surface dynamics; Surface or interface magnetism; Electron and spin dynamics; Spin-Orbit Interaction at Surfaces; Electronic structure; Nanotribology; Solid/liquid interfaces; Graphene; Others)

O 41.101: Poster

Dienstag, 23. März 2010, 18:30–21:00, Poster B1

Influence of adhesion interaction between rough surfaces on real contact area formation — •Alexander Kovalev1,2, Nikolai Myshkin2, and Heinz Sturm11Federal Institute of Materials Research and Testing (BAM), D-12200 Berlin, Germany — 2Metal-Polymer Research Institute (MPRI), 246050 Gomel, Belarus

Friction units used in the micromechanical systems have a very high surface to volume ratio, so there are high contact adhesion and friction, leading to low operational reliability. For reliable estimating of the adhesion effect is necessary to take into account the local physical-mechanical properties of the asperities and the real geometry of rough surfaces in micro- and nanoscale. The aim of work was to study formation of the real contact area (RCA) between rough surfaces taking into account the action of adhesion force. The contact simulation was carried out involving the well-known contact models of Hertz, JKR, and DMT at micro/nanoscale of forces and deformations level transformed to the Winkler foundation. The DLC coating used for this study was deposited on the silicon plate using a pulsed vacuum arc deposition system. The surface topography of DLC coating was measured with typical AFM. It was found the adhesion force has obvious action at the external load up to 100 *N. At the external load about 100 mN deformation is comparable with basic roughness and adhesion interaction has insignificant effect on RCA. Using the JKR theory has been shown that the dependence between the adhesion force and deformation has S-shaped pattern like the bearing surface curve.

100% | Mobil-Ansicht | English Version | Kontakt/Impressum/Datenschutz
DPG-Physik > DPG-Verhandlungen > 2010 > Regensburg