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Regensburg 2010 – scientific programme

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TT: Fachverband Tiefe Temperaturen

TT 27: CE: Poster Session

TT 27.8: Poster

Wednesday, March 24, 2010, 14:00–18:00, Poster D1

Preparation and characterization of PdCoO2 thin films grown by Pulsed Laser Deposition — •Stefan Hirsch, Philipp Komissinskiy, and Lambert Alff — TU Darmstadt, Materialwissenschaft, Darmstadt, Deutschland

PdCoO2 has a hexagonal delafossite crystal structure with the lattice constants of a = 2.83 Å and c = 17.74 Å, and a low resistivity of 4.7 µΩcm perpendicular to the c-axis at 260 K [1]. The aforementioned property is unusual for an oxide material and makes it interesting for thin film applications as an electrode in epitaxial all-oxide heterostructures.

The thin films were produced by pulsed laser deposition (PLD). Single crystals of PdCoO2 were synthesised out of PdCl2 and CoO in evacuated silica tubes. The crystals were grinded, pressed and sintered to a cylindrical pellet to obtain a target for the PLD process. The growth mechanism of the thin films on single crystal substrates was monitored by reflection high energy electron diffraction (RHEED). The thin films were characterized by X-ray diffraction, atomic force microscopy, magnetisation and resistivity measurement from 4.2 to 300 K.

The authors thank DFG GK 1035.

[1] M.Tanaka et al., J. Physical Society of Japan 65, 3973 (1996)

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