Dresden 2011 – wissenschaftliches Programm
A 26.44: Poster
Donnerstag, 17. März 2011, 16:00–18:30, P2
Development of a High Current Electron Beam Ion Trap — •Thomas Baumann, José Crespo López-Urrutia, and Joachim Ullrich — Max-Planck-Institut für Kernpyhsik, Heidelberg, Germany
A novel high current electron beam ion trap (EBIT) charge breeder is currently being constructed at the MPI-K Heidelberg in collaboration with the NSCL (MSU) and TRIUMF. The design is based on the TITAN- and FLASH-EBIT, and will utilize an electron gun capable of producing an electron beam of up to 5 A, which is strongly compressed by a 7T magnetic field, to produce and trap highly charged ions from any element. The increased electron beam current will result in an extremely high current density within the trap region that allows for faster charge breeding compared to any other existing EBIT. This enables the new EBIT to produce He-, H-like or bare ions of heavy elements in hundreds of ms. These ions can be studied within the EBIT by various spectroscopic instruments or being extracted to further experiments. First performance tests of the EBIT are presented. Furthermore the machine allows for the study of charge state optimization and a further reduction of charge breeding times which will support the development of future EBIT charge breeders.