Dresden 2011 – wissenschaftliches Programm

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A: Fachverband Atomphysik

A 5: Photoionization I

A 5.6: Vortrag

Montag, 14. März 2011, 15:45–16:00, BAR 106

Photoelectron Time-of-Flight Spectroscopy in a hard X-ray Regime — •Markus Ilchen1, Sascha Deinert1, Leif Glaser1, Frank Scholz1, Jörn Seltmann1, Peter Walter1, and Jan Grünert21Deutsches Elektronen Synchrotron, Notkestraße 85, 22609 Hamburg — 2European XFEL, Albert-Einstein-Ring 19, 22761 Hamburg

Using photoelectron time-of-flight spectroscopy for the determination of several Synchrotron and FEL beam properties is a well characterized method for the soft X-ray regime. Upcoming and already working XFEL facilities as well as hard X-ray photon beamlines at Synchrotron Radiation facilities like PETRA III at DESY are also highly interested in online beam diagnostics in terms of beam positioning, energy, flux and the degree of photon polarization. The energy range in which this method is successfully tested was increased from the soft X-ray regime up to 15 keV. Not only diagnosis but also angle resolved photoelectron spectroscopy of rare gases like Argon, Krypton and Xenon were performed in that energy range at the P09 beamline at PETRA III. The actual status of the developed spectrometer, the latest measurements for polarization determination as well as the angular distribution of Xe 2p electrons from threshold up to 7 keV will be presented. Adaptability to XFELs in terms of shot to shot polarization analysis and relevant technical issues will be discussed.

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