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DS: Fachverband Dünne Schichten
DS 11: Thin Film Characterisation: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS, ...) IV
DS 11.5: Talk
Monday, March 14, 2011, 16:45–17:00, GER 38
Neutron Reflectometry and GISANS studies of Thin Films at Refsans — •Jean-François Moulin1, Martin Haese-Seiller1, Reinhard Kampmann1,2, Matthias Pomm1, and Andreas Schreyer2 — 1Helmoltz Zentrum Geesthacht, Institute of Materials Research, Instrument REFSANS Lichtenbergstr. 1 85747 Garching (Germany) — 2Helmoltz Zentrum Geesthacht Institut für Werkstoffforschung Abteilung WPN,Max-Planck-Straße 1 21502 Geesthacht (Deutschland)
Neutron reflectometry (NR) and grazing incidence small angle neutron scattering (GISANS) are two complementary techniques which enable to study the structure of thin films in a non destructive/non invasive manner. Given the sensitivity of neutron scattering to the isotopic composition of the system under investigation, contrast enhancement can be used to acces information that would otherwise remain masked e.g to conventional X-Ray methods.
The characteristics and operation modes of the neutron reflectomer REFSANS (which is operated at the FRM2 reactor near Munich) will be presented stressing how this versatile instrument can help elucidating the structure of different classes of materials. On one hand, examples of out of plane structure resolution via NR experiments performed on polymers, biological systems and metallic multilayers will be presented. On the other hand, the TOF-GISANS method will be introduced and it will be shown how it enables to resolve the lateral structure of thin films. Here too, examples from different fields of material physics will be shown.