Dresden 2011 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films
DS 42.23: Poster
Mittwoch, 16. März 2011, 15:00–17:30, P1
Characterization of bulk-heterojunction layers by imaging ellipsometry — •Christian Röling1, Mathias Vaupel2, Kristian O. Sylvester-Hvid3, and Peter H. Thiesen1 — 1Accurion GmbH, Stresemannstr. 30, 37079 Göttingen — 2Zeiss GmbH, Göttingen — 3Riso National Laboratory for Sustainable Energy, DTU, Denmark
Conductive polymers and polymer-fullerene blends are promising materials for OLED and plastic solar cell applications. Blends prepared by two different methods, silk-printing and spin-coating were imaged, characterized and mapped using the spectroscopic imaging ellipsometer nanofilm_ep3se.
The optical characterization of bulk-heteroconjugate layers with imaging ellipsometry offers new information on the thickness distribution and refractive index distribution. Ellipsometric contrast micrographs are useful tools for the layer inspection concerning homogeneity and morphology, especially for the optimization of the coating process.