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Dresden 2011 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films

DS 42.40: Poster

Mittwoch, 16. März 2011, 15:00–17:30, P1

Structure and morphology of co-evaporated pentacene-perfluoropentacene thin films[1] — •Christian Frank1, Alexander Hinderhofer1, Takuya Hosokai1, Andrea Resta2, Alexander Gerlach1, and Frank Schreiber11Institut für Angewandte Physik, Universität Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany — 2ESRF, BP 220, F-38043 Grenoble, France

The morphology as well as the structure of thin films, consisting of pentacene (PEN) and perfluoropentacene (PFP)[2] binary blends on SiO2, were investigated by means of x-ray reflectivity and grazing incidence x-ray diffraction. Furthermore, reciprocal space maps of these blends with different volume fractions show the co-existence of two intermixing phases in addition to pure PEN and PFP crystallites. The question whether these intermixing occurs on a molecular length scale is addressed. The σ-phase, with its long molecular axis nearly perpendicular to the substrate, is thermally stable and nucleates predominantly at high temperatures. The λ-phase (long molecular axis nearly parallel to the substrate) exhibits a growth behavior, which is enhanced by low temperatures. Additionally, both phases can tentatively be identified within the reciprocal space maps.

[1] A. Hinderhofer, C. Frank, T. Hosokai, A. Resta, A. Gerlach, F. Schreiber, submitted

[2] A. Hinderhofer, U. Heinemeyer, A. Gerlach, S. Kowarik, R. M. J. Jacobs, Y. Sakamoto, T. Suzuki, F. Schreiber, J. Chem. Phys. 127, 194705 (2007)

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