Dresden 2011 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 42: Poster I: Progress in Micro- and Nanopatterning: Techniques and Applications (jointly with O); Spins in Organic Materials; Ion Interactions with Nano Scale Materials; Organic Electronics and Photovoltaics; Plasmonics and Nanophotonics (jointly with HL and O); High-k and Low-k Dielectrics (jointly with DF); Organic Thin Films; Nanoengineered Thin Films; Layer Deposition Processes; Layer Properties: Electrical, Optical, and Mechanical Properties; Thin Film Characterisation: Structure Analysis and Composition; Application of Thin Films

DS 42.50: Poster

Mittwoch, 16. März 2011, 15:00–17:30, P1

Characterization of temperature-sensitive swelling behavior of PNIPAAm brushes via in-situ infrared ellipsometry — •Andreas Furchner¹, Dennis Aulich¹, Eva Bittrich², and Karsten Hinrichs¹ — ¹Leibniz-Institut für Analytische Wissenschaften - ISAS - e. V. — ²Leibniz-Institut für Polymerforschung Dresden e. V.

Over the last years, polymer brushes have received growing attention owing to their stimuli-responsive surface properties. In particular, mixed brushes, consisting of at least two different polymers, are interesting, since they represent biofunctional surfaces for controlled protein and cell adsorption due to stimuli-responsive behavior on changes in, for example, temperature, pH, or solvent.

Infrared Spectroscopic Ellipsometry (IRSE), a method for studying film properties at the solid-liquid interface, allows to study the structural and chemical properties of polymer layers and therefore makes it possible to tune mixed brush systems to the specific needs.

As an intermediate step towards a better understanding of mixed temperature-sensitive brushes, poly(N-isopropyl acrylamide) (PNIPAAm) mono-brushes were investigated using ex-situ as well as in-situ SE. The information about optical and structural properties obtained by fitting SE data to an appropriate optical layer model were then used to characterize the temperature-sensitive swelling behavior of PNIPAAm brushes.