Dresden 2011 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 64: Organic Thin Films III
DS 64.5: Vortrag
Freitag, 18. März 2011, 15:00–15:15, GER 38
Investigation of electronic properties and morphology of an n-channel perylene tetracarboxylic diimide thin film — •Franziska Lüttich1, Harald Graaf1, Christian von Borczyskowski1, Antonio Facchetti2, and Antoine Kahn3 — 1Chemntiz University of Technology, Chemnitz, Germany — 2Polyera Corporation, Skokie IL, USA — 3Princeton University, Princeton NJ, USA
We report on the influence of thickness and substrate on the electronic density of states and on the surface potential of an air-stable n-channel perylene tetracarboxylic diimide semiconductor thin film. Ultra-violet photoelectron spectroscopy (UPS) and Inverse photoelectron spectroscopy (IPES) show a variation of the band gap and of the electron affinity of the material as a function of substrate. The organic thin films were fabricated with Polyera ActivInk™ N1200 (PDI8-CN2) by molecular beam deposition on Gold or native Siliconoxide and then analyzed in an ultra-high vacuum chamber without exposure to ambient atmosphere.
The thin films were further investigated under ambient conditions using an atomic force microscope (AFM) to gain information of the topography. Additional Kelvin-Probe force microscopic (KPFM) measurements give insight into the local resolved surface potential.