Dresden 2011 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 85: Poster Session II

HL 85.28: Poster

Donnerstag, 17. März 2011, 18:00–21:00, P4

Analysis of Multidimensional Fourier Transform Spectroscopy for Semiconductors with a Phenomenological Level Model — •Christian Wiebeler, Matthias Reichelt, and Torsten Meier — Department of Physics and CeOPP, University of Paderborn, Warburger Str. 100, D-33098 Paderborn, Germany

Optical two-dimensional Fourier transform spectroscopy has been used to study the properties of semiconductor nanostructures in four-wave-mixing like experiments. [1] Applying a phenomenological level model, we numerically and analytically analyze the main features of excitonic and biexcitonic contributions [2] in a semiconductor quantum well by solving the optical Bloch equations. The method is extended to three-dimensional Fourier transform spectroscopy [3] to investigate a recent experiment. [4].

K. W. Stone et al. Science 324, 1169 - 1173 (2009).
[2] T. Zhang et al. Proc. Nat. Acad. Sci. 104, 14227 (2007).
[3] C. Wiebeler, Modellrechnungen zur mehrdimensionalen Spektroskopie exzitonischer Resonanzen in Halbleiter-Nanostrukturen, Bachelor Thesis, University of Paderborn (2010).
[4] S. Cundiff, private communication.