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MA: Fachverband Magnetismus

MA 22: Magnetic Measurement Methods

MA 22.3: Talk

Tuesday, March 15, 2011, 11:30–11:45, HSZ 403

Element-selective measurement of magnetic multilayers using a tabletop high-harmonic soft X-ray source. — •Roman Adam1, Patrik Grychtol1, Dennis Lvovsky1, Chan La-O-Vorakiat3, Stefan Mathias2,3, Moritz Plötzing1, Justin Shaw4, Hans Nembach4, Tom Silva4, Timm Rohwer5, Martin Aeschlimann2, Henry Kapteyn3, Margaret Murnane3, and Claus Schneider11Institute of Solid State Research, Research Centre Jülich, Jülich, Germany — 2TU Kaiserslautern und Forschungszentrum OPTIMAS, Kaiserslautern, Germany — 3Department of Physics and JILA,University of Colorado, Boulder, CO, USA — 4Electromagnetics Division, National Institute of Standards and Technology, Boulder, CO, USA — 5Institute of Experimental and Applied Physics, University Kiel, Kiel, Germany

We performed static and time-resolved magneto-optic measurements on Ni/Ru/Fe and Ni/Cr/Fe multilayers using resonant scattering of laser-generated extreme ultraviolet (XUV) radiation tuned to the M absorption edges of Fe (53eV) and Ni (67eV). By exploiting the linear magneto dichroic effect a clear element selective magnetic contrast upon magnetization reversal can be obtained[1]. Our experiments show that the laser-generated higher harmonics can be employed for element-selective probing of magnetic multilayers with femtosecond time resolution, thus demonstrating a new experimental approach to measure ultrafast spin dynamics in heterogeneous magnetic systems. [1] C. La-O-Vorakiat et al., PRL 103, 257402 (2009.

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