Dresden 2011 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 30: Magnetic Semiconductors I
MA 30.8: Vortrag
Mittwoch, 16. März 2011, 12:45–13:00, HSZ 401
Voigt effect measurements on PLD grown nickel oxide thin films — •Scarlat Camelia1, Mok Kah Ming1, Zhou Shengqiang1, Lorenz Michael2, Grundmann Marius2, Helm Manfred1, Schubert Mathias3, and Schmidt Heidemarie1 — 1Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstraße 400, 01328 Dresden, Germany — 2University Leipzig, Linnéstrasse 5, 04103 Leipzig, Germany — 3University of Nebraska-Lincoln, 209N WSEC, Lincoln, Nebraska 68588-0511, USA
NiO has great potential applications in spin valves, magnetooptical sensors, optical fibers, solar thermal absorbers, or in non-volatile resistive random memories. In our study NiO, NiMnO, and NiMnLiO thin films have been grown on double-side polished r-plane sapphire substrates by pulsed laser deposition. We measured the complex Voigt angle [1] which is a second-order magneto-optic effect. The polarization state of light after transmission through a sample consisting of ca. 1 µm thick, weak ferromagnetic and diamagnetic NiO thin films on purely diamagnetic r-plane sapphire substrates has been modelled using the 4×4 matrix formalism in dependence of an external magnetic field applied in-plane, i.e. in Voigt configuration. The modelling results revealed that for the bare diamagnetic substrate the Voigt angle depends parabolically on the external magnetic field and that the weak ferromagnetic and diamagnetic NiO thin films changed the parabolic dependence of the Voigt angle in the range of ±0.3 T to a flat-top shape in agreement with the experimentally determined Voigt angle. [1] C. Scarlat et al., Phys. Stat. Sol. (C) 7 (2010) 334-337.