Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MI: Fachverband Mikrosonden
MI 3: TEM- and SEM-based Material Analysis
MI 3.4: Vortrag
Montag, 14. März 2011, 16:15–16:30, BEY 81
Enhancing electron diffraction through precession — •Giuseppe Pavia1, Loic Patout2, Gerd Benner1, and Harald Niebel1 — 1Carl Zeiss NTS, Oberkochen, Germany — 2ONERA, Paris, France
Nanostructures are often investigated in Transmission Electron Microscopy (TEM), and electron diffraction (ED) can be used to solve nanocrystals. Electrons interact very strongly with matter, and the diffracted intensities are highly dynamical. Precession Electron Diffraction (PED) is a recent technique delivering more kinematical diffraction patterns.
We have used an in column energy filtered TEM equipped with precession electron diffraction hardware, which allows working up to 3 deg precession angle, and energy filtering of the precession patterns. High Order Laue Zones, useful for space group symmetry determination and to enhance fine structure details, appear more clearly.
We have compared a microdiffraction pattern and a precession microdiffraction pattern performed along the orientation [010] of a sample TiSi2 with a space group Fddd. For cubic systems, this orientation allows to distinguish the Bravais lattice and the presence of glide mirrors. We show that with precession, we conserve the distinction of the gap and the difference of periodicity between the ZOLZ and the FOLZ is improved.
References
1. Vincent R. and Midgley P., (1994) Ultramicroscopy 53 271