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MI: Fachverband Mikrosonden
MI 5: X-Ray Spectrometry and Tomography
MI 5.9: Talk
Tuesday, March 15, 2011, 12:30–12:45, BEY 81
Development of high energy spin-resolved photoelectron spectroscopy technique for the exploration of novel functional materials for spintronic applications. — •G. Stryganyuk1, E. Ikenaga2, X. Kozina1, T. Sugiyama2, K. Kobayashi3, K. Inomata4, A. Gloskovskii1, G. Schoenhense1, G. Fecher1, and C. Felser1 — 1Johannes Gutenberg - University, Mainz, Germany — 2Japan Synchrotron Radiation Research Institute, SPring-8, Hyogo, Japan — 3National Institute for Materials Science, SPring-8, Hyogo, Japan — 4NIMS, Tsukuba 305-0047, Japan
Growing interest in search and development of spintronic materials requires spin resolved studies of their electronic structure. We report on the development of spin-resolved HAXPES technique which is under the implementation at BL47XU beamline of SPring-8. Spin-resolved HAXPES technique is facilitated by a combination of Scienta R-4000-10keV hemispherical analyzer with new spin detector based on Spin-Polarized Low Energy (104.5 eV) Electron Diffraction (SPLEED) at W(100) surface. Spin-resolution efficiency of the detection system has been tested with secondary spin-polarized electrons from exchange-biased CoFe thin film on top of IrMn antiferromagnetic layer. The throughput of SPLEED detector has been improved via optimization of electron focusing. This improvement enabled the increase of resolution and spin-resolved measurements for valence states with a countrate of about 20-50 cps.
This work is financially supported by DfG-JST (FE633/6-1).