Parts | Days | Selection | Search | Updates | Downloads | Help

MM: Fachverband Metall- und Materialphysik

MM 12: Postersitzung I

MM 12.46: Poster

Monday, March 14, 2011, 17:30–19:00, P5

TEM diffraction used for 3D profile analysis of nanomaterials — •Christoph Gammer, Clemens Mangler, Hans-Peter Karnthaler, and Christian Rentenberger — University of Vienna, Physics of Nanostructured Materials, Boltzmanngasse 5, 1090 Wien, Austria

Nanocrystalline FeAl was made by high pressure torsion deformation of the B2 ordered intermetallic compound Fe-45at.%Al. In this study it is shown that quantitative results for the 3D analysis of bulk nanocrystalline materials can be obtained using profile analysis of selected area diffraction patterns (PASAD). This method allows a quantitative local scale analysis of a wide range of nanomaterials. TEM diffraction patterns showing rings were recorded with a large range of tilting angles (±52^∘ along the shear direction). By applying different tilting angles of the incident beam, the morphology of the nanocrystallites was analysed by using the software PASAD-tools (www.univie.ac.at/pasad). It should be pointed out that because of the strong scattering factor in electron diffraction, the diffraction rings can be recorded in seconds thus allowing to cover a large range of tilting angles in a short time. To compare the results gained from diffraction patterns with those from direct images, TEM samples were cut out of the bulk samples to link them directly to the shear direction and to the shear plane. Both, planar and cross sections of nanocrystalline FeAl were investigated to study the shape and morphology of the nanocrystallites. The 3D reconstruction gained from the images of the different cuts agrees very well with the 3D results gained from the diffraction patterns.