Dresden 2011 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 31: Postersitzung II
MM 31.28: Poster
Mittwoch, 16. März 2011, 17:15–18:45, P5
Shear-stress induced grain boundary motion in nanocrystalline Pd90Au10 — •Manuel Grewer1, Aaron Weis2, and Rainer Birringer1 — 1Universität des Saarlandes FR 7.2 Experimentalphysik, Saarbrücken, Deutschland — 2Karlsruher Institut für Technologie - Institut für Nanotechnologie, Eggenstein-Leopoldshafen, Deutschland
The role of shear stress as a driving force for grain boundary migration is a topic which is currently attracting much attention [1,2]. The miniaturized shear compression specimen [3] is a versatile tool to impose large shear deformation during mechanical testing. This shear deformation is strongly localized in the gauge section of the test specimen. Thus it provides an appropriate testing geometry to study grain boundary migration in nanocrystalline materials under dominant shear stress. We investigate the evolution of the grain size distribution function, which has been derived from TEM dark field images, before and after plastic shear deformation of nanocrystalline Pd90Au10 with an initial grain size of 10 nm. We find clear evidence for shear deformation driven grain boundary migration at room temperature and >15% plastic strain.
[1] J.W. Cahn et al., Acta mater. 54 (2006), 4953-4975, [2] T.J. Rupert et al., Science 326 (2009), 1686-1690, [3] M. Ames et al., Mater. Sci. Eng. A 528 (2010), 526-532