Dresden 2011 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 16: Scanning probe methods I
O 16.5: Vortrag
Montag, 14. März 2011, 16:00–16:15, WIL C307
Miniature active damping stage for Scanning Probe Applications in Ultra High Vacuum — •Maximilian Assig1, Alexandra Ast2, Andreas Koch1, Wolfgang Stiepany1, Carola Strasser1, Klaus Kern1, and Christian R. Ast1 — 1Max-Planck-Institut für Festkörperforschung, Stuttgart — 2Institut für Technische und Numerische Mechanik der Universität Stuttgart
Scanning Probe experiments demand a low vibration level
to keep the distance between tip and sample constant. Small changes
in the spacing between probe and sample result in enormous
variations of the measured signal no matter if it is the tunneling
current in Scanning Tunneling Microscopy (STM) or atomic forces and
phase shift in Atomic Force Microscopy (AFM) measurements. We
present a six-degree of freedom active damping technique based on a
Stewart platform (Hexapod) which is to operate in Ultra High Vacuum
(UHV)[1]. We outline the main working principle and show the effect
of the internal damping on Scanning Tunneling Microscopy
measurements of a Si(111) 7x7 surface at Room Temperature.
D. Stewart, Proc. Instn. Mech. Engrs, 180, 371, 1965