Dresden 2011 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 16: Scanning probe methods I
O 16.7: Vortrag
Montag, 14. März 2011, 16:30–16:45, WIL C307
4-Tip LT-STM with High Resolution SEM — •Bastian Schnitzler1, Frank Matthes1, Daniel E. Bürgler1, Claus M. Schneider1, Bernd Günther2, and Markus Maier2 — 1Peter Grünberg Institute (PGI-6), FZ Jülich — 2Omicron Nanotechnology GmbH
A new type of in-situ 4-tip scanning tunneling microscope will be presented featuring low temperatures less than 5 K, four independent tips for scanning and conductance measurements as well as a high resolution scanning electron microscope (SEM) and a super conducting coil providing a magnetic field of 25 mT.
The LT-Nanoprobe system has been developed in a collaboration between Omicron and the Peter Grünberg Institute. It is designed to provide excellent STM-qualities in scanning and spectroscopy, while being compact to be cooled down to LHE temperature. Further applications regarding (4-Point) conductance measurements of nanostructures benefit of a SEM resolution down to 20 nm to locate and contact nanostructures like quantum wires and Nanotubes.
System design and features will be discussed and first measurements will be presented.