Dresden 2011 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 54: Particles and clusters I
O 54.2: Vortrag
Mittwoch, 16. März 2011, 15:15–15:30, WIL C307
Small-Angle X-ray Scattering (SAXS) for metrological size determination of nanoparticles — •Gudrun Gleber1, Michael Krumrey1, Armin Hoell2, Levent Cibik1, Stefanie Marggraf1, and Peter Müller1 — 1Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin — 2Helmholtz-Zentrum Berlin, Albert-Einstein-Str. 15, 12489 Berlin
To measure the size of nanoparticles, different measurement methods are available but their results are often not compatible. In the framework of an European metrology project we use Small-Angle X-ray Scattering (SAXS) to determine the size and size distribution of nanoparticles in aqueous solution, where the special challange is the traceability of the results.
The experiments were performed at the Four-Crystal Monochromator (FCM) beamline in the laboratory of Physikalisch-Technische Bundesanstalt (PTB) at BESSY II using the SAXS setup of the Helmholtz-Zentrum Berlin (HZB). We measured different particles made of PMMA and gold in a diameter range of 200 nm down to about 10 nm. The aspects of traceability can be classified in two parts: the first is the experimental part with the uncertainties of distances, angles, and wavelength, the second is the part of analysis, with the uncertainty of the choice of the model used for fitting the data. In this talk we want to show the degree of uncertainty, which we reached in this work yet.