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TT: Fachverband Tiefe Temperaturen

TT 47: TR: Nanoelectronics I - Quantum Dots, Wires, Point Contacts 1

TT 47.2: Talk

Thursday, March 17, 2011, 10:45–11:00, HSZ 304

Obtaining the Full Counting Statistics from Time Dependent Simulations for Strongly Correlated Systems — Dmitry Bagrets¹, Sam Carr², and •Peter Schmitteckert¹ — ¹Institute of Nanotechnology, Karlsruhe Institute of Technology — ²Institut für Theorie der Kondensierten Materie, Karlsruhe Institute of Technology

Recent advances in the simulation of time evolution of correlated electron systems led to progress in understanding transport properties of nano scale systems attached to leads. Time dependent simulations enable the extraction of the IV characteristic [1,2] and noise correlations [3] from the transient evolution of a charge imbalanced quench. In this work we extend the idea of obtaining the Full Counting Statistics (FCS) from time dependent simulations [4] of the cumulant generating function and apply it to model systems such as the interacting resonant level model. The simulations are performed within the framework of the density matrix renormalization group approach.
E. Boulat, H. Saleur, and P. Schmitteckert, Phys. Rev. Lett. 101, 140601 (2008).
A. Branschädel, G. Schneider, and P. Schmitteckert; Ann. Phys. 522, 657 (2010).
A. Branschädel, E. Boulat, H. Saleur, and P. Schmitteckert; Phys. Rev. B 82, 205414 (2010); Phys. Rev. Lett. 105, 146805 (2010).
K. Schönhammer; Phys. Rev. B 75, 205329 (2007).