Karlsruhe 2011 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 81: Strahldiagnose / CSR II
T 81.7: Vortrag
Dienstag, 29. März 2011, 18:15–18:30, 30.22: 022
Laser and electron beam diagnostics with wire scanners in the XUV-seeding experiment at FLASH — •Eugen Hass1, Armin Azima1, Francesca Curbis1, Hossein Delsim-Hashemi1, Markus Drescher1, Ulrich Hipp1, Theopilos Malrezopoulos1, Velizar Miltchev1, Manuel Mittenzwey1, Marie Rehders1, Jörg Rossbach1, Juliane Rönsch-Schulenburg1, Roxana Tarkeshian1, Marek Wieland1, Sasa Bajt2, Stefan Düsterer2, Katja Honkavaara2, Tim Laarmann2, Holger Schlarb2, Shaukat Khan3, Rasmus Ischebeck4, and Jörn Bödewaldt1 — 1Universität Hamburg — 2Desy Hamburg — 3DELTA Dortmund — 4PSI Villigen
The free-electron laser (FLASH) in Hamburg delivers intense femtosecond laser pulses in the extreme ultra violet and soft X-ray spectral range for many kinds of experiments, like material science and femtochemistry. To improve the FEL properties in terms of spectral stability, a direct seeding experiment (sFLASH), using a high harmonic generation source as a seed laser was installed at FLASH. The longitudinal and transversal overlap of the seed laser and electron beam is crucial for the seeding process. Among others, wire scanners are used for measuring the transverse laser and electron beam profiles, to perform the transverse overlap. Wire scanners are scanning a thin wire across the electron beam or the laser while measuring the interaction between electrons or photons whith the wire. The interaction produces a flux of secondary particles, which are detected with beam loss monitors or MCP detectors.