Berlin 2012 – wissenschaftliches Programm

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KR: Fachgruppe Kristallographie

KR 6: 100 years since the Laue experiment: Topical aspects of diffraction and scattering (Joint Session KR, BP, DF, GP, MA, MI, MM; related to SYXD)

Dienstag, 27. März 2012, 09:30–12:45, EMH 225

09:30 KR 6.1 Hauptvortrag: The discovery of X-ray interferences, the role of characteristic radiation therein and potential applications of the Laue method in modern engineering. — •Hans-Jürgen Ullrich, Siegfried Däbritz, Enrico Langer, Jürgen Bauch, Andreas Danilewsky, and Peter Paufler
10:00 KR 6.2 Thermal diffuse scattering as a complementary tool in the study of lattice dynamicsBjörn Wehinger, Alexeï Bosak, and •Michael Krisch
10:15 KR 6.3 Brillouin scattering of ultrashort optical and x-ray pulses from quasi-monochromatic phonon wavepackets — •Marc Herzog, André Bojahr, Jevgenij Goldshteyn, Steffen Mitscherling, Wolfram Leitenberger, Dmitry Khakhulin, Michael Wulff, Ionela Vrejoiu, Roman Shayduk, Peter Gaal, and Matias Bargheer
10:30 KR 6.4 Following Strain-Induced Mosaicity Changes of PbZr0.2Ti0.8O3 Thin Films by Ultrafast Reciprocal Space Mapping — •Daniel Schick, André Bojahr, Marc Herzog, Peter Gaal, and Matias Bargheer
10:45 KR 6.5 Analysis of the size and shape of colloidally prepared nanocrystals by Rietveld refinement — •Holger Borchert, Xiaodong Wang, Marta Kruszynska, Joanna Kolny-Olesiak, and Jürgen Parisi
11:00 KR 6.6 Strain measurement in semiconductor nanostructures by convergent electron nanoprobe diffraction — •Knut Müller, Andreas Rosenauer, Marco Schowalter, Josef Zweck, Rafael Fritz, and Kerstin Volz
11:30 KR 6.7 Theory of Electron Magnetic Circular Dichroism — •Jan Rusz
11:45 KR 6.8 Magnetic structure of magnetoelectric NdFe3(BO3)4 under applied magnetic fields — •Jorge E. Hamann-Borrero, Sven Partzsch, Sergio Valencia, Claudio Mazzoli, Christian Hess, A. Vasiliev, L. Bezmaternikh, Bernd Büchner, and Jochen Geck
12:00 KR 6.9 Monoclinic Symmetry in Barium TitanateChristian Eisenschmidt, •Hans Theo Langhammer, and Günther Schmidt
12:15 KR 6.10 Multilayer Optics for Modern X-ray Analytical Equipment — •Andreas Kleine, Jörg Wiesmann, Bernd Hasse, Jürgen Graf, Uwe Heidorn, Steffen Kroth, Frank Hertlein, and Carsten Michaelsen
12:30 KR 6.11 Reconstruction phenomena at the interfaces of LaCoO3 single films: A resonant x-ray reflectivity study — •Jorge E. Hamann-Borrero, Abdullah Radi, Woo Seok Choi, Sebastian Macke, Ronny Sutarto, Feizhou He, George A. Sawatzky, Ho Nyung Lee, and Vladimir Hinkov
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