Berlin 2012 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 17: Magnetic Measurement Methods
MA 17.3: Vortrag
Dienstag, 27. März 2012, 12:15–12:30, EB 202
Atomic Force Microscopy Incorporated with Magnetic Sample Modulation: a new approach to detect the magnetic nanomaterials — •Matthias A. Fenner1, Jing-jiang Yu2, and Jayne C. Garno3 — 1Agilent Technologies, Lyoner Str. 20, 60528 Frankfurt, Germany — 2Nanotechnology Measurement Division, Agilent Technologies, Inc., Chandler, AZ 85226, USA — 3Department of Chemistry, Louisiana State University, Baton Rouge, LA 70803, USA
A new atomic force microscopy (AFM) method for detecting magnetic nanomaterials with much higher spatial resolution and sensitivity is presented [1]. It is referred to as magnetic sample modulation (MSM), since an AC magnetic field excites mechanical oscillations of magnetic nanomaterials on surfaces during imaging. The AFM operates in contact mode using a nonmagnetic tip. Frequency and amplitude of the mechanical response of the sample are detected by changes in tip deflection. Thus, the AFM tip serves as a force and motion sensor for mapping the response of magnetic nanomaterials. The investigations are facilitated by nanofabrication methods combining particle lithography with organic vapor deposition and electroless deposition of iron oxide, to prepare designed test platforms of magnetic materials at nanometer length scales. Examples of detecting magnetic nanoparticles and magnetic biospecies at single molecular level will be presented.
[1] Anal. Chem. 2009, 81, 4792-4802