Berlin 2012 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MA: Fachverband Magnetismus
MA 24: Joint Session "Soft X-ray Resonant Scattering for Complex Structural and Magnetic Investigations" (jointly with KR), Organization: Eberhard Goering (MPI-IS Stuttgart)
MA 24.6: Vortrag
Mittwoch, 28. März 2012, 12:15–12:30, BH 243
Local Magnetic Structure at the Fe3O4/ZnO Interface — •Sebastian Brück1, Markus Paul2, He Tian3, Ozan Kirilmaz2, Andreas Müller2, Kai Fauth1, Eberhard Goering4, Jo Verbeeck3, Gustaaf van Tendeloo3, Michael Sing2, and Ralph Claessen2 — 1University of New South Wales and ANSTO, Sydney, Australia — 2Physikalisches Institut, Universität Würzburg, Würzburg, Germany — 3Electron Microscopy for Materials Science, University of Antwerp, Antwerp, Belgium — 4Max Planck Institute for Intelligent Systems (former Metals Research), Stuttgart, Germany
Magnetite, Fe3O4, is a half-metal with 100% spin polarization of the minority band at the Fermi level. This together with its good conductivity match to standard semiconductors makes it a promising candidate for polarized spin injection into semiconductor materials such as Si, GaAs, or ZnO. An important aspect for such applications is the magnetism directly at the interface between Fe3O4 and the semiconductor. Soft x-ray resonant magnetic reflectometry (XRMR) is a technique which is capable of providing structural and magnetic depth profiles with 0.1nm resolution. We present a detailed XRMR and electron energy loss spectroscopy (STEM/EELS) study of an epitaxial Fe3O4 thin film grown directly on a semiconducting ZnO substrate. Consistent chemical profiles at the interface between ZnO and Fe3O4 are found from XRMR and EELS. The magnetic depth profile of tetragonal Fe3+ and octahedral Fe2+ ions in Fe3O4 is derived with monolayer resolution and reveals a change in the Fe stoichiometry directly at the interface.