Berlin 2012 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 38: MagneticThin Films I
MA 38.6: Vortrag
Donnerstag, 29. März 2012, 10:45–11:00, H 0112
X-ray Magnetic Linear Dichroism in reflection at the 2p and 3p edges of antiferro-magnetic MnNi and NiO — •Marc Tesch1, Markus Gilbert1, Hans-Christoph Mertins1, Daniel Bürgler2, Claus Schneider2,3, and Peter Oppeneer4 — 1FH Münster, Stegerwaldstr. 39, D-48565 Steinfurt — 2FZ Jülich GmbH, Peter Grünberg Inst. (PGI-6), D-52425 Jülich — 3Fakultät f. Physik and CeNIDE, Uni Duisburg-Essen, D-47048 Duisburg — 4Depart. of Physics, Uppsala Uni., Box 530, S-751 21 Uppsala, Sweden
Antiferromagnetic (AFM) materials find key applications in novel spintronic devices. Typically, AFM layers are embedded in a stack of nonmagnetic and ferro-magnetic layers. Therefore, a probing-depth sensitive, element-specific experimental technique, which can discriminate signals from ferro- and antiferro-magnets, is needed for their investigation. X-ray magnetic linear dichroism (XMLD) in reflection is most suited for this purpose as proven for the 2p edges in grazing incidence [1]. We present XMLD spectra of AFM layers of MnNi and NiO at the Mn and Ni 3p edges, respectively, and compare them with spectra at the corresponding 2p edges, obtained at DELTA. Due to the increased reflectivity at low energy 3 p edges, XMLD spectra could be taken from grazing up to normal incidence that show clear and large magnetic signals. The data are discussed with respect to the electronic structures and are compared with ab-initio calculated XMLD spectra.
[1] P.M. Oppeneer et al. Phys. Rev. B 67, 052401 (2003)