Berlin 2012 – wissenschaftliches Programm

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MI: Fachverband Mikrosonden

MI 5: X-ray spectrometry and analysis of works of art

MI 5.6: Vortrag

Mittwoch, 28. März 2012, 11:45–12:00, TA 201

Quantitative 3D micro-XRF analysis with laboratory setup — •Timo Wolff, Wolfgang Malzer, Christian Herzog, and Birgit Kanngießer — Institut für Optik und Atomare Physik, TU-Berlin, Hardenbergstr. 36, 10623 Berlin

X-ray fluorescence (XRF) is a wide spread analytical tool for elemental analysis. Due to its non destructive character and a relative high information depth it is frequently used various fields of science. The development of thermoelectric cooled silicon drift chamber detectors (SDD) and of X-ray optics, enabling a spatial resolution in the micrometer range, even strengthened this trend. Using a confocal setup 3D micro-XRF is possible. In this technique a second optic is mounted in front of the detector entrance to limit the field of view. The optics form a probing volume with dimensions in the micrometer range from which fluorescence is detected only. By moving the sample through this volume depth resolved information can be obtained from the sample in a non destructive way. This confocal geometry influences another aspect of XRF, making this technique to an interesting tool: the possibility of quantitative analysis without reference samples, based on the fundamental parameter (FP) method. A new analytical description was developed and successfully tested with 3D micro XRF measurements with synchrotron radiation on standard reference samples and on archaeomtric objects in the last years. The procedure was now extended to setups with polychromatic tube excitation. Thus, for the first time quantitative 3D micro-XRF in the laboratory is possible.