Berlin 2012 – wissenschaftliches Programm
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MI: Fachverband Mikrosonden
MI 6: X-ray imaging, holography and tomography
MI 6.1: Vortrag
Mittwoch, 28. März 2012, 12:30–12:45, TA 201
Confocal STXM - a novel approach to 3D X-ray microscopy — •Andreas Späth1, Jörg Raabe2, Christian Riess3, Simon Schöll3, Joachim Hornegger3, and Rainer H. Fink1 — 1Friedrich-Alexander Universität Erlangen-Nürnberg, Physical Chemistry II, Erlangen, Germany — 2Swiss Light Source (SLS), Paul Scherrer Institut, Villigen Switzerland — 3Friedrich-Alexander Universität Erlangen-Nürnberg, Computer Science 5, Erlangen, Germany
Common approaches to 3D microscopy with soft X-rays (e.g. tomography, holography, etc.) are often disadvantaged by a high experimental or computational effort. We will present a novel procedure to obtain 3D images of nanostructured soft matter based on the PolLux scanning transmission X-ray microspectroscope installed at a bending magnet beamline of the Swiss Light Source [1]. Using latest zone-plate technonology, imaging is not only achieved with very high lateral resolution (limit 12 nm) [2], but also with a depth of focus of better than 550 nm. Image stacks from the variation of the sample position along the X-ray propagation axis offers the opportunity to confocal imaging. Thus, we are able to image nanoscopic inhomogeneities of the sample (e.g. nanoparticles) within each confocal plane and recheive 3-dimensional reconstructions by determining the focus plane of these features. The required analysis tools are provided by computational sciences and comfortable in application and computing time. We will discuss the opportunities and limitations in conventional STXM imaging.
1. J. Raabe, et al., Rev. Sci. Instrum. 79, 2008, 113704.
2. J. Vila-Comamala, et al., Ultramicroscopy 109, 2009, 1360.