Berlin 2012 – wissenschaftliches Programm
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MI: Fachverband Mikrosonden
MI 8: Poster – Microanalysis and microscopy
MI 8.4: Poster
Mittwoch, 28. März 2012, 15:00–17:30, Poster E
Precision of high-resolution EBSD strain determination using cross-correlation and phase-only correlation — •Thomas Riedl1, Horst Wendrock2, and Stefan Wege2,3 — 1Institut für Werkstoffwissenschaft, TU Dresden, 01062 Dresden, Germany — 2IFW Dresden, P.O. Box 270116, 01171 Dresden, Germany — 3now at: MPI für Eisenforschung, 40237 Düsseldorf, Germany
The present contribution analyses the precision of EBSD elastic strain measurement based on cross-correlation or phase-only correlation of regions of interest distributed over experimental patterns [1]. By means of correlation peak fitting and least-squares minimisation the procedure allows to obtain the eight independent components of the displacement gradient tensor with an average standard deviation of 1.2*10−4 under best conditions. It is shown that the cross-correlation version provides a better angular resolution compared to its phase-only counterpart. Moreover, optimum parameters such as Fourier filter widths and fit region sizes are determined as a function of the pattern signal-to-noise ratio. The achievable precision is also evaluated for specimen rotation and bending experiments. Finally, the application of the strain measurement method to diffusive-displacive phase transformations is discussed [2].
[1] A.J. Wilkinson et al.: Ultramicr. 106 (2006) 307
[2] G. Miyamoto et al.: Acta Mater. 57 (2009) 1120