Berlin 2012 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 21: Microstructure and Phase Transformations II

MM 21.6: Vortrag

Dienstag, 27. März 2012, 11:30–11:45, H 0106

Measuring dihedral angles in polycrystalline grain microstructures — Stefan Schäfer and •Dana Zöllner — Abteilung Materialphysik, Institut für Experimentelle Physik, Otto-von-Guericke-Universität, 39106 Magdeburg

Dihedral angles in polycrystalline grain microstructures are known to control the morphology of the structure and therewith also the microstructural evolution during grain growth. Hence they play an important role in grain growth theories, but are rarely measured. For exact measurements two problems have to be considered. First, assumptions have to be made regarding the shape of the grain boundaries and their triple junctions. Secondly, in digital discretised grain microstructures grain boundaries usually do not have a physical representation in the images but are defined to be between two grains of unlike orientation and are - due to the use of pixels in 2D and voxels in 3D - not smooth but rather staircase-shaped.

In this work we discuss a method to measure dihedral angles in two and three dimensional discretised (digital) grain microstructures based on trisections of circles resp. spheres. Measuring errors are examined and the method is applied to grain structures obtained by Monte Carlo Potts model simulations.