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DPG

Berlin 2012 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 31: Nanocharacterization

Mittwoch, 28. März 2012, 10:15–12:15, H 1029

10:15 MM 31.1 HR(S)TEM and TAP analyses of embedded Pb nanoparticles — •Anna Moros, Harald Rösner, and Gerhard Wilde
10:30 MM 31.2 Characterization of nano-particle size and orientation using auto-correlation analysis of electron microscopy images — •Thomas Weiß, Dieter Akemeier, and Andreas Hütten
10:45 MM 31.3 Iron L- and M-edges of iron containing minerals measured by inelastic x-ray scattering — •Alexander Nyrow, Christian Sternemann, Max Wilke, Christoph Sahle, Kolja Mende, Laura Simonelli, Robert Gordon, Nozomu Hiraoka, Florian Wieland, Metin Tolan, and John Tse
11:00 MM 31.4 X-ray Raman scattering: A spectroscopic tool to study low Z elements at extreme pressure and temperature — •Kolja Mende, Alexander Nyrow, Christian Sternemann, Christian Schmidt, Max Wilke, Christoph J. Sahle, Thorsten Brenner, Laura Simonelli, Marco Moretti Sala, and Metin Tolan
11:15 MM 31.5 (contribution withdrawn) Probing intermediate valence in rare-earth compounds by X-ray excitations goes along with significant final state effects — •K. Kummer, Yu. Kucherenko, S. Danzenbächer, C. Krellner, C. Geibel, S. L. Molodtsov, C. Laubschat, and D. V. Vyalikh
11:30 MM 31.6 Structural investigations on the interfacial layer between diamonds and metal matrices in diamond tools via X-ray scattering — •Andre Steffen, Michael Paulus, Christian Sternemann, Manuel Pinho Ferreira, Christian Kronholz, Ralph Wagner, Wolfgang Tillmann, and Metin Tolan
11:45 MM 31.7 Material Processing with Femtosecond Laser Pulses — •Steffen Fiedler, Robert Irsig, Anna Oniszczuk, Josef Tiggesbäumker, Conrad Schuster, Anna Svanidze, Neeke Rothe, Stefan Lochbrunner, and Karl-Heinz Meiwes-Broer
12:00 MM 31.8 Mechanism of nanostructure formation during in in-situ consolidation of mechanically-milled copper — •Mohsen Samadi Khoshkhoo, S. Scudino, H. Bahmanpour, A. Kauffmann, J. Freudenberger, R. Scattergood, M. J. Zehetbauer, C. C. Koch, and J. Eckert
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