Berlin 2012 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 16: Scanning probe methods II

O 16.8: Vortrag

Montag, 26. März 2012, 17:45–18:00, MA 043

Hidden Atomic Resolution - Investigation of a Complex Oxide Material with 2D Force Spectroscopy — •Christin Büchner, Leonid Lichtenstein, Stefanie Stuckenholz, Markus Heyde, and Hans-Joachim Freund — Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 14195 Berlin, Germany

For the first time, a model system of an amorphous oxide network has been prepared. A double layer film of silicon dioxide was grown on a Ru(0001) support, exhibiting a complex network of differently sized ring units [1]. This atomically flat system was investigated using frequency-modulated dynamic force microscopy (FM-DFM). Under very stable imaging conditions (UHV, low temperature), we performed two-dimensional (2D) force spectroscopy mapping. Measuring Δf(z)-curves up to very short distances to the surface, a significant variation in the contrast generating shift can be observed. The repulsive regime exhibits a significantly higher corrugations than the attractive branch. This method gives insight into the contrast formation of DFM and may be employed for different systems, where achieving atomic resolution is challenging. High resolution scanning probe microscopy images of a thin vitreous silica film will be presented together with 2D force spectroscopy data. The force mapping results will be discussed together with a general consideration of characteristic Δf(z)-curves.

[1] Lichtenstein et al., Angew. Chem. IE. doi: 10.1002