Berlin 2012 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 35: Poster Session II (Polymeric biomolecular films; Nanostructures; Electronic structure; Spin-orbit interaction; Phase transitions; Surface chemical reactions; Heterogeneous catalysis; Particles and clusters; Surface magnetism; Electron and spin dynamics; Surface dynamics; Methods; Electronic structure theory; Functional molecules)
O 35.99: Poster
Dienstag, 27. März 2012, 18:15–21:45, Poster B
Nanoparticle Manipulation With Combined AFM/SEM — •Michael Feldmann1, Antoni Tekiel2, Jessica Topple2, Dirk Dietzel1, Peter Grutter2, and André Schirmeisen1 — 1Institut für Angewandte Physik, JLU Giessen, Germany — 2Department of Physics, McGill University, Montréal, Canada
To understand friction on a fundamental level the investigation of friction with nanoparticles has presented itself as a very promising approach[1][2]: a nanoparticle is pushed by an AFM tip to measure the friction between the particle and a substrate. These experiments allow to study friction of extended single asperity nanocontacts. If this kind of experiment is executed with just a single AFM tip as a probing channel, the tip can either move the particle or image it, but not both at the same time. To gain a better understanding of the involved processes and to increase control over the manipulation, we performed nanoparticle manipulations with a combined AFM / SEM system. This setup enabled us to move the particles with the AFM, while simultaneously observing the particle translations with scanning electron microscopy. We observed that the AFM tip is not only able to push the particles, but also to pull the particles over the substrate due to the adhesion between tip and particle. On the other hand complete detachment of the particles from the substrate did never occur, consistent with the assumption of having very flat interfaces and thus high adhesion between particle and substrate.
[1] D. Dietzel et. al., Phys. Rev. Lett. 101, 125505 (2008)
[2] D. Dietzel et. al., Phys. Rev. B 82, 035401 (2010)