Berlin 2012 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 64: Plasmonics and nanooptics III
O 64.1: Vortrag
Donnerstag, 29. März 2012, 10:30–10:45, MA 005
Antenna-enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes — •Nina Rauhut1, Nitin Saxena1, Michael Engel2, Ralph Krupke2, Mathias Steiner3, and Achim Hartschuh1 — 1Department Chemie und CeNS, LMU, München, Germany — 2Karlsruher Institut für Technologie, Karlsruhe, Germany — 3T. J. Watson Research Center, IBM, Yorktown Heights, NY,USA
The unique optical and electronic properties of single-walled carbon nanotubes (SWCNTs) make these quasi 1D structures promising building blocks for nanoscale electronic and optoelectronic devices [1]. A powerful method to characterize SWCNT based field-effect transistors is scanning photocurrent microscopy (SPCM), where a focused laser spot is raster scanned across a device, recording the photocurrent signal at the same time. Due to diffraction SPCM measurements have been restricted so far to a spatial resolution of few hundred of nanometers.
We report on the first photocurrent measurements along single SWCNTs with sub 30 nm spatial resolution. Our approach extends conventional tip-enhanced near-field optical microscopy (TENOM) in which the diffraction limit is overcome by exploiting antenna-enhanced localized fields [2]. Combining SPCM and TENOM, we succeeded in simultaneously recording enhanced optical and photocurrent images with nanoscale resolution providing new insight into the optoelectronic properties of nanostructures.
[1] Avouris, P.; Chen, Z.; Perebeinos, V. Nat. Nanotechnol. 2007, 2, 605 [2] Hartschuh, A. Angew. Chemie (Int. Edition) 2008, 47, 8178