Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

O: Fachverband Oberflächenphysik

O 64: Plasmonics and nanooptics III

O 64.2: Vortrag

Donnerstag, 29. März 2012, 10:45–11:00, MA 005

Near-Field Investigation of Nanostructures with Normal Incidence Photoemission Electron Microscopy — •Pascal Melchior1, Ernst Jan Vesseur2, Alexander Fischer1, Markus Rollinger1, Daniela Bayer1, Christian Schneider1, Albert Polman2, and Martin Aeschlimann11Fachbereich Physik and Research Center OPTIMAS, Technische Universität Kaiserslautern, Germany — 2FOM Institute AMOLF, Amsterdam, The Netherlands

Photoemission electron microscopy (PEEM) enables the mapping of the near-field distribution of nanostructures under broadband laser excitation with a subwavelength spatial resolution. The combination with ultrafast laser pulses makes PEEM to an excellent technique to address the electron dynamics of nanoantennas by means of nonlinear photoemission. In standard PEEM systems, a grazing angle of incidence is used for illumination. However, the asymmetric illumination causes phase retardation effects and complex intensity distributions because of the superposition of higher order plasmonic modes. The complexity of the observed photoemission behavior under grazing angle makes the interpretation of static near-field distributions as well as time-resolved measurements challenging. With a new PEEM configuration we now excite the sample under normal-incidence and are thus able to eliminate these effects. We show first results of phase-resolved normal-incidence (NI) measurements on gold ring resonators that enable us to distinguish the resonance behavior of individual nanostructures with a subwavelength spatial resolution. The results are corroborated with FDTD calculations of the near-field properties of the structures.

100% | Bildschirmansicht | English Version | Kontakt/Impressum/Datenschutz
DPG-Physik > DPG-Verhandlungen > 2012 > Berlin