Dresden 2013 – wissenschaftliches Programm
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HK: Fachverband Physik der Hadronen und Kerne
HK 35: Instrumentation
HK 35.5: Vortrag
Dienstag, 5. März 2013, 15:15–15:30, WIL-A221
Characterization of double sided silicon micro-strip sensors with a pulsed infra-red laser system for the CBM experiment — •Pradeep Ghosh1 and Juergen Eschke2 — 1Goethe Universitaet, Frankfurt — 2GSI Helmholtzzentrum and FAIR GmbH, Darmstadt
The Silicon Tracking System (STS) of the Compressed Baryonic Matter (CBM) experiment at FAIR is composed of 8 tracking stations consisting of 1292 double sided silicon micro-strip sensors.
For the sensor development and for the quality assurance of produced sensors a laser test system has been built up. The aim of the sensor scans with the pulsed infra-red laser system is to determine the charge sharing between strips and to measure the uniformity of the sensor response over the whole active area. The prototype sensors tested with the laser system so far have 256 strips with a pitch of 50 µm on each side. They are read out by the self-triggering n-XYTER prototype read-out electronics.
The laser system measures the sensor response in an automatized procedure at several thousand positions across the sensor with focussed infra-red laser light (σspotsize≈15 µm, λ=1060 nm). The duration (∼5ns) and power (few mW) of the laser pulses is selected such, that the absorption of the laser light in the 300 µm thick silicon sensors produces a number of about 24k electrons, which is similar to the charge created by minimum ionizing particles in these sensors. Results of laser scans for different sensors will be presented.
Supported by HIC-for-FAIR, HGS-HIRe and H-QM.