Dresden 2013 – wissenschaftliches Programm

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HK: Fachverband Physik der Hadronen und Kerne

HK 9: Instrumentation

HK 9.3: Vortrag

Montag, 4. März 2013, 11:45–12:00, HSZ-405

Quality Assurance of double-sided silicon strip sensors for Silicon Tracking System in the CBM experiment at FAIR — •Pavel Larionov and Pradeep Ghosh — Goethe Universität, Frankfurt am Main

Silicon Tracking System (STS) is the central tracking detector of Compressed Baryonic Matter (CBM) experiment that aims to explore the QCD phase diagram in the region of high net baryonic densities and moderate temperatures.

STS consists of 8 tracking layers of double-sided silicon strip sensors with self-triggered read-out system. The challenge is to cope with high hit rates up to 10 MHz/cm², high tracking density, high radiation load up to 1×10¹⁴ n_eq/cm² and high momentum resolution for the physics case. Hence, the Quality Assurance (QA) procedures become important in the process of building up modules and stations of these sensors. This presentation describes the various QA tests and procedures that need to be performed to identify the viability, performance and efficiency of these sensors for tracking system in CBM experiment.In particular QA in CBM-STS includes visual inspection, bulk and interstrip parameters measurements, sensor efficiency and total signal to noise ratio tests, measurements of irradiated sensors, bonding, low temperature performance and current stability tests. Results of various QA tests of sensor prototypes will be shown.

Supported by HIC for FAIR, HGS-HIRe and H-QM.