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MS: Fachverband Massenspektrometrie

MS 4: Resonance Ionisation MS, ICPMS and others I

MS 4.1: Hauptvortrag

Dienstag, 19. März 2013, 11:00–11:30, F 442

Surface Analysis with ToF-SIMS and Laser-SNMS: Possibilities and Limitations — •Heinrich F. Arlinghaus — Westfälsiche Wilhelms-Universität Münster, Physikalisches Institut, Wilhelm-Klemm.Str. 10, 48149 Münster, Germany

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) and laser-postionization secondary neutral mass spectrometry (Laser-SNMS) have been applied to detect and image specific compounds, intrinsic elements, and molecules with sub-micron resolution in different types of samples, as well as to obtain 3D molecular images from frozen biological samples.

In the presentation, the possibilities and limitations of ToF-SIMS and Laser-SNMS for detecting and imaging elements and molecules in biological samples will be discussed. Specifically, the possibilities for enhancing the detection sensitivity by using polyatomic and cluster primary ions and different laser post-ionization schemes were investigated. The data show that cluster-ion bombardment is very useful for enhancing molecular yield and for detecting large molecules in biological samples, while Laser-SNMS results in much higher detection sensitivity for elements and specific molecules and is particularly well suited for imaging ultra-trace element concentrations. Imaging experiments clearly show that both ToF-SIMS and Laser-SNMS are well suited for imaging elements and molecules in complex samples and are both very valuable techniques for advancing applications in various research fields such as life, materials, and earth sciences.