Hannover 2013 – wissenschaftliches Programm
MS 9.4: Vortrag
Donnerstag, 21. März 2013, 12:00–12:15, F 442
Ion source memory in 36Cl accelerator mass spectrometry — •Stefan Pavetich1, Shavkat Akhmadaliev1, Maurice Arnold2, Georges Aumaître2, Didier Bourlès2, Josef Buchriegler3, Robin Golser3, Karim Keddadouche3, Martin Martschini2, Silke Merchel1, Georg Rugel1, and Peter Steier3 — 1HZDR, Dresden, Germany — 2ASTER, Aix-en-Provence, France — 3VERA,Vienna, Austria
Since the DREAMS (Dresden Accelerator Mass Spectrometry) facility went operational in 2011, constant effort was put into enabling routine measurements of long-lived radionuclides as 10Be, 26Al and 41Ca. For precise AMS-measurements of the volatile element Cl the key issue is the minimization of the long term memory effect . For this purpose one of the two original HVE sources was mechanically modified, allowing the usage of bigger cathodes with individual target apertures. Additionally a more open geometry was used to improve the vacuum level. To evaluate this improvement in comparison to other up-to-date ion sources, a small interlaboratory comparison had been initiated. The long-term memory effect in the Cs sputter ion sources of the AMS facilities VERA, ASTER and DREAMS had been investigated by running samples of natural 35Cl/37Cl-ratio and samples containing highly enriched 35Cl (35Cl/37Cl > 500). Primary goals of the research are the time constants of the recovery from the contaminated sample ratio to the initial ratio of the sample and the level of the long-term memory effect in the sources.
 R. Finkel et al., NIMB 294 (2013) 121.