Jena 2013 – wissenschaftliches Programm
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P: Fachverband Plasmaphysik
P 19: Poster: Theorie und Modellierung
P 19.3: Poster
Donnerstag, 28. Februar 2013, 14:00–16:00, Poster EG
Plasma diagnostics applying K-line emission profiles of mid-Z materials — •Yiling Chen, Heidi Reinholz, and Gerd Röpke — Institut für Physik, Universität Rostock, 18051 Rostock
Narrow K-line emission of some keV is known as an appropriate light source for Thomson scattering on warm dense matter with solid and even over-solid electron density. However, as the K-spectra are emitted from a warm dense plasma themselves we are also able to infer plasma parameters by studying the line profiles [1].
Theoretical treatment of spectral line shifts is applied to various moderately ionized mid-Z materials. We focus on the opposing influence of ionization/excitation (blue shift) and plasma polarization effects (red shift). Synthetic spectra of Si Kα are compared with high-resolution Si Kα1,2 x-ray fluorescence spectra [2].
To describe the x-ray satellite structures KαLN,(N=0−5) produced by
11.4 MeV/u Ca projectiles penetrating a low-density SiO2 aerogel target [3], different configuration of the emitting Si ion have to be considered as well [4,5].
[1] U. Zastrau, A. Sengebusch, and et al., High Energy Density Phys. 7, 47-53 (2011). [2] Zhenlin Liu, Shouichi Sugata, and et al., Phys.Rev.B 69, 035106 (2004). [3] J.Rzadkiewicz, A. Gojska, and et al., Phys.Rev.A 82, 012703 (2010). [4] Katarzyna Slabkowska and Marek Polasik, Journal of Phys. 163, 012040 (2009). [5] R. L. Watson, F. E. Jenson, and T. Chiao, Phys.Rev.A 10, 4 (1974).