Parts | Days | Selection | Search | Updates | Downloads | Help

HL: Fachverband Halbleiterphysik

HL 52: Graphene: Characterization and devices (HL, jointly with MA, O, TT)

HL 52.7: Talk

Wednesday, March 13, 2013, 11:00–11:15, H17

Characterization of large-scale graphene CVD with far-infrared radiation — •Christian Cervetti¹, Boris Gorshunov^1,4,5, Elena Zhukova^1,4,5, Martin Dressel¹, Klaus Kern^2,3, Marko Burghard², and Lapo Bogani¹ — ¹1. Physikalisches Institut, Universität Stuttgart — ²Max Planck Institut für Festkörperforschung — ³Institute de Physique de la Matière Condensée, Ecole Polytechnique de Lausanne, Switzerland — ⁴A.M.Prokhorov General Physics Institute, Russian Academy of Sciences, Russia — ⁵Moscow Institute of Physics and Technology (State University), Russia

We use monochromatic terahertz (THz) spectrometer and standard Fourier-transform spectrometer to measure the conductance of large scale single layer graphene obtained by chemical vapor deposition. We demonstrate the extreme sensitivity of the THz conductance to copper particles produced on graphene during the transfer process, making THz spectroscopy a powerful tool for monitoring the removal of unwanted leftovers during the production of large scale graphene samples.