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HL: Fachverband Halbleiterphysik
HL 92: Poster Session: Structure and transport in organic photovoltaics; Photovoltaics; Impurities/Amorphous semiconductors; New materials
HL 92.3: Poster
Thursday, March 14, 2013, 16:00–20:00, Poster A
Scanning Kelvin Probe Microscopy on FIB-milled crosssections of different organic photovoltaic devices — •Christian Müller1,2,3, Rebecca Saive1,2,3, Michael Scherer1,2,3, Michael Kröger1,3, and Wolfgang Kowalsky1,2,3 — 1InnovationLab GmbH, Heidelberg, Germany — 2Kirchhoff-Institut für Physik, University Heidelberg, Germany — 3Institut für Hochfrequenztechnik, Technische Universität Braunschweig, Germany
Scanning Kelvin Probe Microscopy (SKPM) is a powerful tool to investigate the charge transport in organic devices and has been successfully applied to Organic Field Effect Transistors (OFETs). Conventional SKPM is restricted to the device's surface. Hence we have developed a new method to investigate device's cross-sections by milling with a Focused Ion Beam (FIB) and adjacent Scanning Probe Microscopy (SPM) characterization. We applied this method to organic solar cells and could reveal the potential distribution along the charge transport path. Sample preparation and measurements were performed in-situ in a combined SEM/FIB crossbeam system with an integrated SPM to avoid sample degradation by ambient air.