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Regensburg 2013 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 11: Topical Session: TEM-Symposium - STEM

Monday, March 11, 2013, 15:45–18:15, H4

15:45 MM 11.1 Topical Talk: Scanning transmission electron microscopy at atomic resolution — •Ferdinand Hofer, Gerald Kothleitner, and Werner Grogger
16:15 MM 11.2 High Precision STEM Imaging by Non-Rigid Alignment and Averaging of a Series of Short Exposures — •Paul Voyles, Andrew Yankovich, Benjamin Berkels, Peter Binev, and Wolfgang Dahmen
16:30 MM 11.3 Characterisation of ultrathin ferroelectric film using scannning transmission electron microscopy — •Daesung Park, Anja Herpers, Tobias Menke, Regina Dittmann, and Joachim Mayer
16:45 MM 11.4 A transmission electron microscopy study on highly strained BiFeO3 thin films — •Young Heon Kim, Akash Bhatnagar, Ji Hye Lee, Marin Alexe, Eckhard Pippel, and Dietrich Hesse
17:00 MM 11.5 Microscopic origin of the giant ferroelectric polarization in strained BiFeO3 thin films — •Marta D. Rossell
17:15 MM 11.6 STEM HAADF characterization of dilute Bi containing GaAs — •Nikolai Knaub, Andreas Beyer, Peter Ludewig, and Kerstin Volz
17:30 MM 11.7 Analytical transmission electron microscopy in the third dimension — •Bert Freitag, Arda Genc, Jonathan Winterstein, Huikai Cheng, Lee Pullan, and Joerg Jinschek
17:45 MM 11.8 High-resolution HAADF-STEM analysis of hetero-interfaces — •Anna Moros, Harald Rösner, and Gerhard Wilde
18:00 MM 11.9 Electrostatic Phase Plates for Transmission Electron Microscopy — •Simon Hettler, Manuel Dries, Nicole Frindt, Rasmus R. Schröder, and Dagmar Gerthsen
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