O 53: Scanning Probe Methods II
Mittwoch, 13. März 2013, 16:00–19:15, H31
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16:00 |
O 53.1 |
Driving a Macroscopic Oscillator with the Stochastic Motion of a Hydrogen Molecule — •Christian Lotze, M. Corso, K.J. Franke, F. v. Oppen, and J.I. Pascual
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16:15 |
O 53.2 |
Improvement of STM Resolution with H-sensitized Tips — Jose Ignacio Martínez, •Enrique Abad, César González, Fernando Flores, and José Ortega
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16:30 |
O 53.3 |
Mapping the surface adsorption potential with the scanning tunneling microscope — •Georgy Kichin, Christian Wagner, Stefan Tautz, and Ruslan Temirov
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16:45 |
O 53.4 |
Voltage pulse shapes in time-resolved STM measured with photons — •Markus Etzkorn, Christoph Große, Klaus Kuhnke, Sebastian Loth, and Klaus Kern
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17:00 |
O 53.5 |
Investigation of the stiffness of the BN-nanomesh by combined STM and AFM measurements at low temperatures — •Tobias Herden, Markus Ternes, and Klaus Kern
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17:15 |
O 53.6 |
Nanoscale imaging of photoelectrons using an atomic force microscope — •Ping Yu and Jürgen Kirschner
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17:30 |
O 53.7 |
The effect of sample resistivity on Kelvin probe force microscopy — •Alfred J. Weymouth and Franz J. Giessibl
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17:45 |
O 53.8 |
Three dimensional scanning lifetime microscopy using diamond — •Philip Engel, Andreas W. Schell, and Oliver Benson
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18:00 |
O 53.9 |
Utilizing dynamic work function measurements to distinguish adsorbates on Si(100) — •Ferdinand Huber, Alfred J. Weymouth, and Franz. J. Giessibl
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18:15 |
O 53.10 |
Probing the probe: tip front atom characterization — •Florian Pielmeier and Franz J. Giessibl
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18:30 |
O 53.11 |
Theoretical Scanning Probe Images of the (001) Surfaces of MnO and NiO — •Mihail Granovskij, Andreas Schrön, and Friedhelm Bechstedt
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18:45 |
O 53.12 |
Scanning Microwave Microscopy combined with Amplitude Modulation Atomic Force Microscopy — •Matthias A. Fenner
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19:00 |
O 53.13 |
Infrared nanoscopy of biomaterials — Adrian Cernescu, Sergiu Amarie, Tobias Geith, Stefan Milz, and •Fritz Keilmann
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