Regensburg 2013 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 58: Poster Session III (Solid-liquid interfaces; Scanning probe and other methods; Electronic structure theory; Spin-orbit interaction)
O 58.46: Poster
Mittwoch, 13. März 2013, 18:15–21:45, Poster B1
Combination of Tuning Fork Non-Contact Atomic Force Microscopy with Field Ion Microscopy — •Sören Zint1, Andreas Nejbert1, Dirk Dietzel1, Jens Falter1, André Schirmeisen1, and Harald Fuchs2 — 1Institute of Applied Physics (IAP), Justus-Liebig-University Giessen — 2Center for Nanotechnology (CeNTech) and Institute of Physics, University of Muenster (WWU)
Non-contact atomic force microscopy (ncAFM) has proven to be a valuable tool for surface characterization with atomic-resolution. For a quantitative comparison between force spectroscopy experiments and corresponding analytical models, knowledge of the true tip geometry is required. One method for determining the tip geometry is the field ion microscopy (FIM) technique. Thus we combined a tuning fork sensor based low temperature AFM with the field ion microscopy technique, in one ultra-high vacuum chamber. With this AFM we can acquire atomically resolved AFM images (e.g. on NaCl) together with force spectroscopy data, while the FIM allows for tip reconstruction of electrochemical etched tungsten tips. This setup enables us now to approach the problem of correlating specific features of force spectroscopy experiments with corresponding tip geometries.