Regensburg 2013 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 77: Electronic Structure and Spin-Orbit Interaction III
O 77.5: Vortrag
Donnerstag, 14. März 2013, 17:00–17:15, H33
Time-of-flight momentum microscopy with imaging spin filter — •Katerina Medjanik1, Sergey Chernov1, Hans-Joachim Elmers1, Christian Tusche2, Alexander Krasyuk2, Jürgen Kirschner2, and Gerd Schönhense2 — 1Institut für Physik, Univ. Mainz — 2Max Planck-Institut für Mikrostrukturphysik, Halle
Momentum microscopy is a novel approach to study the electronic structure of surfaces using the cathode-lens technique, well-known from PEEM. Whereas a PEEM is optimized for best resolution in real space, momentum microscopy aims at an ultimate resolution in k-space (reciprocal space). Up to now, dispersive spectrometers have been used as energy filter [1]. In this contribution we present first results using time-of-flight (ToF) energy dispersion using a delayline detector, adopting concepts of ToF-PEEM [2]. By setting a ToF condition in the 3D (x,y,t) data sets, we define sections in k-space. We optimized the electron optical design such that for start energies up to 80eV the full half space above the sample surface (more than the first Brillouin zone) is imaged with high k-resolution. Using the imaging reflection-type spin filter [3,4], we were able to obtain spin resolution. The instrument allows highly efficient simultaneous spin filtering of many energy sections through momentum space.
Funded by BMBF (05K12UM2) and COMATT.
[1] B. Krömker et al., Rev. Sci. Instrum. 79 (2008) 053702.
[2] G. Schönhense et al., Surf. Sci. 480 (2001) 180.
[3] C. Tusche et al., APL 99 (2011) 032505.
[4] D. Kutnyakhov et al., submitted to Ultramicroscopy.