Dresden 2014 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)

DS 43.4: Poster

Donnerstag, 3. April 2014, 16:00–19:00, P1

Manipulating the Electronic Properties of Manganese Phthalocyanine Thin Films by Potassium Intercalation — •Francisc Haidu¹, Lars Smykalla², Michael Hietschold², and Dietrich R. T. Zahn¹ — ¹Technische Universität Chemnitz, Semiconductor Physics Department, D-09107 Chemnitz, Germany — ²Technische Universität Chemnitz, Solid Surfaces Analysis Group, D-09107 Chemnitz, Germany

Manganese phthalocyanine (MnPc) presents great promise towards molecular spintronics due to its high spin state of S=3/2 which can be lowered to S=1/2 by reaction with molecular oxygen [1] or even increased to S=5/2 by doping with alkali metals [2], which promotes 3 stable n-doped phases [3]. Within this work the changes of the occupied and unoccupied electronic states of K intercalated MnPc were investigated by combined UPS, IPS, XPS, and NEXAFS techniques. MnPc films of 10 nm thickness were prepared by organic molecular beam deposition onto Co foils and consecutively doped by K evaporation from a getter source in UHV conditions. The amount of K was determined by XPS while the NEXAFS Mn L edge branching ratio provides information on the spin states of S=3/2 and S=5/2 for pristine and fully doped MnPc, respectively. Finally, from the UP and IP spectra the evolution of the transport band gap upon K intercalation was revealed.

[1] R. Friedrich et al., J. Chem. Phys. 136, 064704 (2012)

[2] Y. Taguchi et al., J. Am. Chem. Soc. 128, 3313 (2006)

[3] B. Mahns et al., J. Chem. Phys. 134, 194504 (2011)