Dresden 2014 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 6: Thin Film Characterization: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS,...)

DS 6.17: Vortrag

Montag, 31. März 2014, 19:30–19:45, CHE 89

Resonant Soft X-Ray Reflectometry on strained LaSrMnO₄ thin films — •Martin Zwiebler¹, Jorge Enrique Hamann-Borrero¹, Mehran Vafaee², Ronny Sutarto³, Feizhou He³, Lambert Alff², Bernd Büchner¹, and Jochen Geck¹ — ¹IFW Dresden, Helmholtzstraße 20, 01097 Dresden, Germany — ²Institute of Material Sciences, Technische Universität Darmstadt, 64287 Darmstadt, Germany — ³Canadian Light Source Inc., 44 Innovation Boulevard, Saskatoon SK S7N 2V3, Canada

The strong electron-lattice coupling in the perovskite manganites provides a unique opportunity to tune the electronic properties of these materials via lattice strain. LaSrMnO₄ is a good model material with well-known orbital occupation in the bulk material. We present a study of the depth-resolved electronic properties in a tensile strained LaSrMnO₄ film by the means of resonant X-ray reflectometry (RXR) and XAS. We find evidence for Mn²⁺ on the surface and we extract the depth profile of the Mn valence throughout the film.