Dresden 2014 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 6: Thin Film Characterization: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS,...)
DS 6.2: Vortrag
Montag, 31. März 2014, 15:15–15:30, CHE 89
In situ PLD synchrotron characterization for the detection of domain formation during Ba0.5Sr0.5TiO3 growth on MgO — Sondes Bauer1, •Alan Molinari2, Sergey Lazarev1, Andreas Breitenstein1, Philipp Leufke2, Robert Kruk2, Horst Hahn2, and Tilo Baumbach1 — 1Karlsruhe Institute of Technology (KIT), Synchrotron Facility ANKA, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany — 2Karlsruhe Institute of Technology (KIT), Institute of Nanotechnology (INT), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany
A highly sophisticated pulsed laser deposition (PLD) chamber has recently been installed at the Nano beamline of the synchrotron facility ANKA (Karlsruhe, Germany), which allows for comprehensive studies on the PLD growth process of thin films by combining in situ reflection high energy electron diffraction (RHEED) with the in situ synchrotron high resolution X-ray diffraction and surface diffraction methods.
Ba0.5Sr0.5TiO3(BST) grown on MgO is the first system studied in this in situ PLD chamber being analyzed by in situ X-ray reflectivity, in situ two-dimensional reciprocal space maps (2D-RSMs) and acquisition of time resolved diffraction profiles during the ablation process. The stability of morphology during the PLD growth is demonstrated to be seriously affected by the film thickness: after a critical thickness of hc = 107 nm, BST on MgO reveals a splitting of the diffraction peak into two distinguishable peaks proving the formation of a new kind of domain.