Dresden 2014 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 112: Energy materials: CIGS and related photovoltaics

HL 112.4: Vortrag

Freitag, 4. April 2014, 10:15–10:30, POT 112

X-ray fluorescence on Cu(In,Ga)Se2-lamellas — •Philipp Schöppe1, Alexander Kusch1, Michael Oertel1, Claudia Sarah Schnohr1, Andreas Johannes1, Stefanie Eckner1, Manfred Burghammer2, and Carsten Ronning11Institut für Festkörperphysik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany — 2European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France

Compositional and structural properties of the absorber affect significantly the efficiency of Cu(In,Ga)Se2 solar cells. The integral composition is commonly determined using X-ray fluorescence (XRF) with high resolution. However, the absorber is typically inhomogeneous and thus there is a particular interest in collecting information from defined spatial regions in the nanometer range. Hence, XRF mapping with an X-ray beam diameter of approximately 200 to 300 nm was used to investigate cross sections of Cu(In,Ga)Se2 solar cells. In order to implement this improved spatial resolution in the measurement, thin lamellas were prepared using a focused ion beam. Best results were obtained using a lamella thickness of about 250 nm. This enabled us to determine quantitatively the depth dependent composition of the absorber, particularly the Ga gradient, and its spatial distribution.

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