Dresden 2014 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 61: Organic electronics and photovoltaics III (organized by CPP)

HL 61.12: Vortrag

Mittwoch, 2. April 2014, 12:30–12:45, ZEU 260

Structural and electrical characterization of Hex-5T-Hex oligothiophene thin films during film formation — •Eduard Mikayelyan1, Linda Grodd1, Ullrich Pietsch1, Artem. V. Bakirov2, Maxim. A. Shcherbina2, Sergei N. Chvalun2, and Souren Grigorian11University of Siegen — 2Enikolopov Institute of Synthetic Polymeric Materials of Russian Academy of Sciences

Organic semiconductors are attractive for electronics due to the low cost processing methods and their high electrical conductivity. Thiophene based polymers and oligomers are demonstrating relatively high mobility, excellent luminescence properties which used for application in solar cells, radio-frequency identification, etc. [1, 2]. We have investigated the thiophene based oligomer Hex-5T-Hex. Structural characterization has been performed by grazing incidence x-ray diffraction (GIXD)method, in particular we probed the crystallite orientations in prefabricated thin films. The 3D structure of Hex-5T-Hex oligomer evaluated from the in-plane (010), (020) and (021) reflections is consistent with 2D structure suggested from 5T based oligomer self-assembled monolayer (SAM) [3]. Additionally, we found the (100) and (100)' reflections in out-of-plane direction characterizing two different stacking along thiophene backbone axis. In order to correlate the structural properties of oligothiophene thin films with the electrical characteristics both properties were probed simultaneous during film formation. This work was supported by BMBF, project number 05K10PSC.

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